Agilent 4155B Semiconductor Parameter Analyzer – Precision Measurement for Advanced Applications
The Agilent 4155B Semiconductor Parameter Analyzer offers high-precision testing and analysis for semiconductors and electronic devices, designed for research, development, and production environments.
Measurement Range:DC Voltage: ±200 mV to ±200 V, DC Current: ±10 fA to ±100 mA
Resolution:Voltage: 10 nV, Current: 1 fA
Accuracy:±0.05% + 15 μV
Frequency Response:Up to 1 MHz
Test Connections:4-wire low-noise test connections
Display:128×64 dot-matrix LCD display
Dimensions:152 x 165 x 44 mm (W x H x D)
Weight:1.5 kg
The Agilent 4155B Semiconductor Parameter Analyzer is a versatile tool designed to meet the rigorous demands of semiconductor testing and characterization. With its advanced measurement capabilities, this instrument supports precise electrical testing under varying conditions, making it ideal for applications in semiconductor manufacturing, research labs, and academic institutions.
This parameter analyzer offers exceptional measurement accuracy, allowing for detailed analysis of semiconductor properties. Its user-friendly interface and comprehensive test options make it a reliable choice for professionals seeking accurate and efficient testing solutions.
Key Features:
– High-resolution measurement capabilities
– Wide measurement range for diverse applications
– Precise current and voltage measurement
– User-friendly software for easy operation
– Multiple communication interfaces for integration with existing systems
Experience the reliability and precision of the Agilent 4155B in your semiconductor testing processes. Invest in a tool that delivers consistent performance and enhances your research and development efforts.
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