National Instruments PXIe-4844 Real-Time Data Acquisition Module
The NI PXIe-4844 is a high-speed digital pattern generator designed for automated test equipment (ATE) and semiconductor test systems. It offers rapid pattern generation capabilities, making it ideal for testing complex digital circuits.
Channels:4
Sample Rate:Up to 625 MS/s
Bandwidth:Up to 160 MHz
Resolution:16-bit
Memory Depth:Up to 256 MSamples
Output Range:+/-1 Vpp to +/-10 Vpp
Connector Type:BNC
Trigger Source:Internal/External
Interface:PXI Express
Designed for high-performance signal processing tasks, the PXIe-4844 offers unparalleled speed and precision in data acquisition. With a sampling rate up to 2 GS/s and a resolution of 8 bits, it ensures that every detail is captured accurately.
The module supports both software and hardware triggering, making it flexible for various applications. It is compatible with the comprehensive NI LabVIEW software suite, streamlining development and integration.
With a bandwidth of 2 GHz, the PXIe-4844 is capable of handling complex signals without loss of fidelity. This makes it particularly suitable for advanced research and development projects.
Its robust design includes compatibility with PXI Express systems, ensuring seamless integration into existing setups. The front panel features a user-friendly interface that simplifies operation and monitoring.
Engineered with durability in mind, the PXIe-4844 is built to withstand demanding environments. Its compatibility with industry-standard PXI Express standards ensures reliability and long-term performance.
There are no reviews yet.